Renishaw TP200 probe system combines outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system.
The TP200 probe incorporates micro strain gauge transducers delivering excellent repeatability and accurate 3D form measurement even with long styli.
The sensor technology gives sub-micron triggering performance and eliminates the lobing characteristics encountered with standard probes.
The solid state ASIC electronics within the probe ensure reliable operation over millions of trigger points.
TP200 systems
A probe system using strain-gauge mechanisms for higher accuracy and increased life than kinematic touch trigger probes.
The TP200/TP200B combine outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system with excellent productivity.
Overview
The TP200 system components are:
TP200 or TP200B probe body (the TP200B is a variant with increased vibration tolerance TP200 stylus module - choice of fixed overtravel
forces: SF (standard force) or LF (low force)
PI200 probe interface
SCR200 stylus changing rack
There is also an 'EO' module (extended overtravel) which has the same over travel force as the 'SF' but provides increased operating range and protection in the probe Z axis.
The TP200/TP200B offer excellent repeatability and precision 3D form measurement with zero reseat errors and no lobing effect.
The probe has 6 way measuring capability and has stylus reach of up to 100 mm GF stylus.
The stylus module allows rapid exchange between stylus configurations without the need to re-qualify the stylus tips and has a life of>10 million triggers.

TP200 standard force module A-1207-0010