Mitutoyo 525-458-1E Formtracer SV-C4500WB, Contour measuring range X1 axis 200mm, Surface Roughness measuring range X1 axis 200mm, Code SV-C4500W8 with double cone end stylus
Item number:
525-458-1E
| Model | SV-C4500W8 |
|---|---|
| Part Number | 525-458-1E |
| Measuring Speed | 0.00078" - 0.2"/s (0.02 - 5mm/s) |
| Stylus tip radius | 60°/2µm (80µinch) |
| Detector measuring force | 0.75mN |
| Detector Conical taper angle | 60º |
| Applicable standards | JIS ’82 / JIS ’94 / JIS ’01 / ISO ’97 / ANSI / VDA |
| Assessed profiles | PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile), roughness motif, waviness motif |
| Evaluation parameters | PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, PΔq, Pmr (c), Pmr, Pδc, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, RΔq, Rmr (c), Rmr, Rδc, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, WΔq, Wmr (c), Wmr, Wδc, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, |
| Analysis graphs | PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh auto- correlation graph, slope distribution graph, local peak distribution graph, parameter distribution graph |
| Filters | PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Rubust-spline |
| Measuring range X axis | 0-8in 0-200mm |
| Point of stylus | Downward |
| Vertical Travel | 500mm/20" Powered |
| Surface roughness resolution | 0.01 / 0.001 / 0.0001µm (Z1) |
| Contour measuring force | 30mN |
| Stylus tip radius | 25μm, carbide |
| video | https://vimeo.com/58614783 |
Mitutoyo 525-458-1E Formtracer SV-C4500WB, Contour measuring range X1 axis 200mm, Surface Roughness measuring range X1 axis 200mm, Code SV-C4500W8 with double cone end stylus
Availability:
In stock
Item number
525-458-1E
Formtracer SV-C3200
A high-accuracy instrument that allows measurement of surface roughness and form/contour with just one unit. When the detector for form/contour measurement is replaced with that for surface roughness measurement, or vice versa, it is a simple, one-touch replacement without requiring re-routing of the connecting cables
The Formtracer SV-C3200 is available in 6 different models
| Model No. | Traverse range | Vertical travel | Base size | Base material |
| SV-C3200S4 | 100mm | 300mm | 600 x 450mm | Granite |
| SV-C3200S8 | 200mm | 300mm | 600 x 450mm | Granite |
| SV-3200H4 | 100mm | 500mm | 600 x 450mm | Granite |
| SV-3200H8 | 200mm | 500mm | 600 x 450mm | Granite |
| SV-C3200W4 | 100mm | 500mm | 1000 x 450mm | Granite |
| SV-C3200W8 | 200mm | 500mm | 1000 x 450mm | Granite |
- Dramatically increased drive speed (X1 axis: 80mm/s, Z2 axis column: 20mm/s) further reduces total measurement time.
- Mitutoyo has adopted highly rigid ceramic guides, combining small secular change and remarkable resistance to abrasion, to maintain the traverse linearity specification for an extended period of time.
- The drive unit (X1 axis) and column (Z2 axis) are equipped with highly accurate linear encoders (ABS type on the Z2 axis). This improves reproducibility of continuous automatic measurement of small holes in the vertical direction and repeated measurement of parts which are difficult to position.
- Excellent traverse straightness makes this system suitable for handling workpieces calling for high accuracy.
- Compliant with international surface roughness standards.
- Equipped as standard with a high accuracy detector (0.75mN/4mN measuring force) providing a resolution down to 0.0001µm.
- Designed to handle workpieces calling for high accuracy.
Mitutoyo 525-458-1E Formtracer SV-C4500WB, Contour measuring range X1 axis 200mm, Surface Roughness measuring range X1 axis 200mm, Code SV-C4500W8 with double cone end stylus
